WO2012076303A1

WO2012076303A1 - Device and method for efficiently carrying out system test runs

Info

Publication number: WO2012076303A1
Application number: PCT/EP2011/070200
Authority: WO
Inventors: Wieland Eckert; Nicole Wengatz
Original assignee: Siemens Aktiengesellschaft
Priority date: 2010-12-07
Filing date: 2011-11-16
Publication date: 2012-06-14
Also published as: DE102010062553A1

Abstract

The invention relates to a testing device and a testing method for efficiently carrying out system test runs in a system (Z). For each USE CASE of the system (Z) to be tested, a corresponding TEST CASE is provided by the testing device (1), said TEST CASE having a sequence of test steps (TS), in each of which a test stimulus (T-STI) is applied to the system (Z) to be tested and a resulting test response (T-RES) of the system (Z) to be tested is checked by the testing device. The system (Z) to be tested is shifted into a different system state in each test step of the TEST CASE during a system test run on the basis of a starting system state until an end system state (Z_n) for the respective TEST CASE is reached. The system (Z) to be tested is shifted directly into a specific system state (Z_x) by the testing device (1) during a TEST CASE in order to expedite each further system test run, wherein only the corresponding test stimuli (T-STI) are applied to the system (Z) to be tested by the testing device (1) without the test response check during the test steps (TS) for reaching the specific system state (Z_x) if the test responses (T-RES) obtained up until reaching the specific system state (Z_x) in at least one previous system test run have already been successfully checked.

Description

description

Apparatus and method for efficiently performing system test runs

The invention relates to an apparatus and method for efficiently performing system test runs for a system, and more particularly to a test device in a service-oriented architecture ^¬ to increase the testing efficiency.

Complex technical systems, such as Fertigungsanla ^¬ gen, transport vehicles and power protection equipment or ordering ^¬ systems can be subjected to the customer system test runs in their development and before delivery to ensure its correctness in all possible applications or USE CASES. Furthermore, testing of the system may be performed for maintenance or system extension. In particular, so-called "embedded systems", which include both hardware and software components that require more system test runs so that testing of such embedded systems is usually very time-consuming. This is especially true when a high test coverage is required and Reaktio ^¬ nen system errors, for example, a selection of a hardware component must be verified. particularly aufwän ^¬ dig is the testing of a system when a certain Sys ^¬ temzustand of the system must be prepared only by a long sequence of In ^¬ teraktionen, that is, the history for the system behavior of the system is relevant.

It is therefore an object of the present invention to provide a method and apparatus for efficiently performing system test runs in a system where the time required to perform the system test runs of a system is low.

This object is achieved by a test device with the features specified in claim 1. The invention provides a test apparatus for efficiently performing system test runs in a system,

wherein an associated TEST CASE provided by the test device for each use case of the system under test that has a sequence of test steps, where each placed a test stimulus to the system under test at ^¬ and caused thereby test response of the system to be tested is checked by the test apparatus, wherein the system to be tested is placed in a system test run from an initial system state of the system to be tested in each test step of the TEST CASES in another system state until an end system state of the system under test for the respective TEST CASE is achieved wherein in order to accelerate each further system test run in a TEST CASE, the system to be tested is set directly into a specific system state by the test device, in the test steps to reach the determined system state, only the associated test stimuli without a test response check to the Sy be created by the test device, provided that the test responses received until reaching the specific system state in at least one other system test run successfully over ^¬ checked.

The other system test run may be a previous system test run in which the test responses received have already been successfully checked. The test device according to the invention thus makes it possible to increase the test efficiency by modularizing the TEST CASES or applications of the system to be tested with sequences of test steps. In one possible embodiment of the invention

Test device forms a sequence of test steps of a TEST CASES starting from the initial system state of the system until the specific system state has been reached, a test sequence prefix.

In one embodiment of the test device according to the invention, a sequence of test steps of TEST CASES forms a test sequence postfix starting from the determined system state until reaching the end system state for the respective TEST CASE.

By identifying common test sequence prefixes and test sequence postfixes, the test device of the present invention enables optimized scheduling that allows the targeted loading of test modules that execute a set or sequence of test steps to bring the system under test to a defined system state.

In one possible embodiment of the test device according to the invention, the system to be tested is brought into the defined or system state by the test device by setting the system into the determined system state by means of test steps of a selected TEST CAS, starting from the initial system state of the system to be tested is where said selected TEST CASE having an optimum Testsequenzpräfix for jeweili ^¬ gen particular system state.

The test device according to the invention thus selects a TEST CASE on the basis of a specific selection criterion for an optimal test sequence prefix of the TEST CAS.

In a possible disclosed embodiment of the test device according to the invention, the optimal Testsequenzpräfix a mi ^¬ nimale test execution time to achieve the specific system state of the system under test.

In another embodiment, the optimal test sequence prefix has a minimum resource requirement for the test. until the system state of the system under test is reached.

In one possible embodiment, the test device according to the invention has a minimum energy requirement bi for achieving the specific system state.

In one possible embodiment of the test device according to the invention, a TEST CASE is selected on the basis of a combination of selection criteria. A combination of selection criteria is used in particular when conventional selection criteria, such as time requirements and energy requirements, conflict, for example if the system to be tested consumes a lot of energy during fast operation and consumes little energy during slow operation.

In one possible embodiment, a weighted sum of selection criteria or a combination of elementary selection criteria is used.

In another possible embodiment of the test device according to the invention, a combination of selection criteria with a limiting function for selection is used. For example, the combined Selektionskrite ^¬ criterion may be that the system under test approved a vorbe must not exceed energy requirements and at the same time is to work as quickly as possible.

In one possible embodiment of the test device according to the invention, the test stimuli of the test steps of the optimal test sequence prefix are generated by the test device until the system state has been reached as acceleration test modules for the respective system state.

In one possible embodiment of the test device according to the invention, the acceleration test modules are generated by the test device during the runtime of the system test run. In another possible embodiment of the test device according to the invention, the acceleration test modules are generated by the test device before the beginning of a further system test run.

In one disclosed embodiment, the test device of the invention, the generated acceleration test modules in egg ^¬ nem repository or a memory of the test device for further use to be stored.

In one possible embodiment of the test device according to the invention, the acceleration test modules stored in the repository of the test device are dynamically loaded and executed at run time of the system test run at an execution unit of the test device.

In one possible embodiment of the test device according to the invention, the test device has a service-oriented architecture.

In one possible embodiment of the test device according to the invention, the test device is connected via a data interface parts directly to the system to be tested.

In an alternative embodiment of the test device according to the invention, the test device is connected to the system to be tested via a data network.

In one possible embodiment of the test device according to the invention, the system to be tested by the test device is an embedded system which has hardware components and software components.

wherein in the repository of the test device for each component, ie for each hardware component and each software component ^¬ software component of the system to be tested at least one ent ^¬ speaking test service module is provided. It is possible that the test service modules implement different optimization or selection criteria or inject different fault patterns. In one possible embodiment of the invention

The test apparatus simulates a hardware component test component of the system to be tested, an associated test service module of the hardware component to simulate a configurable hardware component to be tested.

In another possible embodiment of the test device according to the invention, the test device is integrated in the system to be tested. The invention further provides a test method for efficiently performing system test runs in a system,

wherein an associated TEST CASE is provided for each use case of the system under test that has a sequence of test steps, where in each case applied a test stimulus to the system under test and characterized hervorge ^¬ called test-response of the system to be tested is checked, wherein the system to be tested is set in a system test run starting from an initial system state in each test ^¬ step of the TEST CASES in another system state until an end system state for the respective TEST CASE is achieved, and

wherein, in order to accelerate each further system test run in a TEST CASE, the system to be tested is set directly into a specific system state in which, during the test steps of the TEST CASES, until reaching the specific system state, only the associated test stimuli without test-response check are sent to the system to be tested provided that the test responses received in at least one system test run until the system state has been reached are successfully checked.

In one possible embodiment of the test method according to the invention, the test procedure generates during the execution of the test procedure. system test runs automatically acceleration test modules and stores them for further system test runs on the respective system to be tested in a repository or a data memory.

In another possible embodiment of the test method according to the invention, this test method for system development is carried out by a test device connected to the system to be tested or by a test device integrated in the system to be tested.

In another possible embodiment of the test method according to the invention, this test method for system maintenance or system diagnosis is performed by a test device connected to the system under test or integrated in the system to be tested.

In another possible embodiment of the test method according to the invention, this test method is carried out for system expansion or, in the case of system modification, by a test device connected to the system to be tested or integrated in the system to be tested.

In the following, embodiments of the method according to the invention and the device according to the invention for the efficient performance of system test runs in a system will be described with reference to the attached figures.

Show it:

Figure 1 is a diagram showing a test used by the test device of the invention and the invention ^shown SSE test method for efficiently performing system test runs CASES with a sequence of test steps, with which the system under test is placed in different system states. Fig. 2 is a diagram illustrating various test sequence prefixes and various test sequence postfixes for a system state of the system under test;

3 is a block diagram showing an embodiment of the test apparatus according to the invention;

4 shows a diagram illustrating the operation of a test device according to the invention and a test method of the invention by way of exporting approximately ^¬ example.

As can be seen from FIG. 1, for each USE CASE or predetermined application of the system 2 to be tested, a corresponding associated TEST CASE or test case can be provided by a test device 1 according to the invention, as shown in FIG. As can be seen from FIG. 1, a TEST CASE or use case comprises the sequence of test steps. In this case, the system 2 to be tested is set to a different system state in a system test run starting from an initial system state Z ₀ in each test step TS of the TEST CAS until an end system state for the respective TEST CASE is reached. For each test step TS of the TEST CAS, a test stimulus is applied to the system 2 to be tested, and a test response of the system 2 to be tested is subsequently checked by the test device 1. In one application, the test stimulus may be a simple bit pattern or test bit pattern or certain requests or events to which the system under test 2 is responding.

The system 2 to be tested can be a complex technical system, for example a transport vehicle, such as an aircraft, a passenger car or a train. Furthermore, it may be in the system under test 2 to a complex manufacturing facility or a component of a Ener ^¬ gieversorgungsnetzwerkes. Another example of a system 2 to be tested is an ordering system, for example wise to order components. Other examples of systems under test are systems for medical Bildge- environment, in particular X-ray, magnetic resonance devices, Ult ^¬ raschallgeräte and Molecular Imaging Devices. Another example of a system 2 to be tested is a system for

Storage and archiving of medical data, in particular image data, diagnostic data, diagnostic data and, for example, treatment plans. Another example of a system under test 2 is a system for processing and assessing such data, in particular a viewing station, a computer aided diagnosis (PCA) device, or medical service accounting systems. The system 2 to be tested can be a single-user system, a multi-user system, or a networked system, whereby the system can be made available to the user as an integrated system and various functions can be combined with one another. Furthermore, the system can consist of similarly replicated units. For example, the system under test may be a cloud computing system.

By the test stimulus T-STI a test step TS forth ^¬ pre called Test Response T-RES is evaluated by the Testvorrich- device 1 and thereby can in a possible embodiment, the obtained test Response T-RES with a expect ^¬ ended target Test Response T-RES are compared. If the received test response T-RES matches the expected target test response, the test response T-RES has been successfully completed. In the example shown in FIG. 1, FIG. 3, in a first system test run, the test device 1 according to the invention provides a test sequence which comprises a plurality of test steps TS1, TS2... TSX in order to define the system 2 to be tested in a specific test step. nated system state Z _x . To speed up the

In the case of a test case of the system 2 to be tested, during each further system test run, the test device 1 according to the invention displaces it directly into the predetermined system test run. state Z _x , wherein in the test steps TS until reaching the specific system state Z _x only the associated test stimuli T-STI without test response verification T-RES are applied to the system under test Z by the test device 1, if that until reaching the determined system state Z _x in at least one previous system test run it have already been successfully verified ^¬ preserved test responses on the part of the test device. 1

In many cases, TEST CASES have the same initial sequence or sequence of test steps TS. In this case, a sequence of test steps TS of a TEST CASES forms a test sequence prefix starting from an initial system state Zo of the system Z to be tested until it reaches the determined system state. As can be seen from FIG. 2, it is possible to arrive at a system state Z via different paths or sequences of test steps TS. In the example shown in FIG. 2, there are m different test sequence prefixes to enter the system state Z. Furthermore, one can leave the system state Z, as shown in Fig. 2, via different paths or sequences of test steps TS. The sequence of test steps of a TEST CASES starting from a specific system state Z _x until reaching an end system state forms a test sequence postfix for the respective TEST CASE. In the example shown in FIG. 2, the system state Z n has different test sequence postfixes.

In the inventive test apparatus 1, an analysis of the possible Testsystempräfixe and Testsystem-, starting from possible system states of the system under test 2 post fixed on the various system states Z Runaway ^¬ leads. The respective system under test Z may make in the OF INVENTION ^¬ to the invention test apparatus 1 based on the analysis results in a possible disclosed embodiment, a classification into different equivalence classes. Equivalent is a test system prefix or sequence of test steps TS with another test system prefix if both are determined from an initial system state in the same one System state Z _x lead. To achieve a specific system state Z _x is a belie ^¬ biges equivalent Testsystempräfix in particular ^¬ sondere a Testsystempräfix that meets a certain optimization criterion can be selected for carrying out the tests. The system under test Z _x is brought about by the test apparatus 1 in a particular test system state Z by the system 2 system state from an initial starting Zo of the system is set by means of test steps TS of a selected test cases in the particular system state Z _x. In this case, the selected _x TEST CASE for each particular system state Z to an optimum Testse ^¬ quenzpräfix. In a possible disclosed embodiment, the optimal Testsystempräfix a minimum test execution ^¬ permanently until reaching the specific system state Z _x. In this embodiment, the test system prefix which has the shortest execution duration is selected. In further possible embodiments, the selected TEST CASE has a test sequence prefix for the particular system state that fulfills another optimization criterion. For example, the optimal test sequence prefix of the TEST CASES has a minimal resource requirement for the system Z to be tested. For example, the optimum test sequence ^¬ prefix to a minimum energy requirement, to enable the system to be tested Z in the particular system state Z _x.

In a possible disclosed embodiment, the test device 1 of the invention, the test stimuli of the test steps TS, for example, the test bit pattern or sequence of test requests, the optimum Testsequenzpräfix be up to reaching the certain system state Z _x as so-called Accelerati ^¬ supply test module for each system status generated by the test device 1. To ^¬ play to enable the system to be tested Z when in a system state Z _x, the test steps TS1 be by performing an acceleration test module each time - TSX executed, ie, it does not occur at each test step TS applying a test stimulus T-STI and corresponding check the test response T-RES. Are once successfully m the test responses T-RES been tested success ^¬ rich by the testing device 1 to any preceding Systemtestlau, the system under test can Z directly by sending or application of the test stimuli T-STI without re-test-response testing in the system state Z _{x are} offset by a corresponding formed acceleration ^¬ test module is loaded and executed. The Be ^¬ schleunigungstestmodule can be generated by the test apparatus 1 during the period of the test system ^¬ run or prior to the beginning of another system test run. The test device according to the invention 1 or test method of the invention thus form a self-learning system, are generated in the corresponding one of a plurality of system test runs during acceleration test ^¬ module, which are stored in a possible execution form in a repository or a data memory of the test device 1 for further use , The test device 1 according to the invention thus dynamically builds up a fund of acceleration test modules. The data stored in the repository of the test apparatus 1 Test modules are the runtime of the system test run example as loaded dyna ^¬ mixed by an execution unit of the test apparatus 1 and executed.

In one possible embodiment of the test device 1 according to the invention, the test device 1 has a service-oriented architecture SOA. In this case, the test device can be connected directly to the system 2 to be tested via a data interface or indirectly connected to the system 2 to be tested via a data network. By using a service-oriented architecture SOA, it is possible to make the individual test steps TS available as service modules by loading them at runtime from a repository into a run-time environment as required and then writing them back again. With egg ner SOA-based workflow engine, the various service modules can be combined and entspre ^¬ accordingly controlled the process. The acceleration test modules are either generated in advance or dynamically generated at runtime. riert. In a possible disclosed embodiment, the respective acceleration test modules test stimuli T-STI can immediately sen ^¬. With time-consuming systems 2 to be tested, the acceleration test modules have correspondingly greater complexity.

3 shows a block diagram for illustrating an exemplary embodiment of the test device 1 according to the invention. As can be seen from FIG. 3, the test device 1 has an execution unit 1A and a repository or a memory 1B. The test device 1 is connected via an interface with a system 2 to be tested. In one possible embodiment, the test device 1 is connected directly to the system 2 to be tested via an interface. In an alternative embodiment, the test device 1 is connected to the system 2 to be tested via a data network, for example a bus. Furthermore, it is possible that the test device 1 according to the invention is integrated in the system 2 to be tested. The execution unit 1A may consist of intelligent scheduling and control. In one possible embodiment, the system 2 to be tested is one

Embedded system, which includes hardware components and software components. Here, in the repository 1B of the test apparatus 1 for each component, i. for each hardware or software component of the system to be tested 1 a corresponding test service module provided. In the to be tested

System 2 may be any complex technical system, for example, a vehicle, an industrial plant or a ^¬ ordering system or the like. The test apparatus 1 as shown in FIG. 3 performs a plurality of system test runs for testing the system 2. In this case, an associated TEST CASE is provided by the test device 1 for each USE CASE or application of the system 2 to be tes ^¬ . This TEST CASE comprises a sequence of test steps TS, in each of which a test stimulus T-STI is applied to the system 2 to be tested, and a test response T-RES of the system Z to be tested is checked by the test apparatus. In the test stimulus For example, a T-STI may be a data or bit pattern or a sequence of particular requests or events for testing the system 2. In the test device 1 according to the invention, it is possible to set the system 2 to be tested in a system test run from an initial system state Z ₀ in each test step TS of the TEST CASES in another system state until an Endsystemzustand for the respective TEST CASE is achieved. Here, the system under test Z directly treated in a certain system state by the test apparatus 1 by for the test steps to reach the certain or defined system state, only the respective test stimuli without test for Accelerat ^¬ nigung of every other system test run at a TEST CASE response checking are applied to the system under test 2 by the test device 1, provided to reach the particular system state Z _x of the system 2 in min ^¬ least a previous system test run, the test responses T-RES obtained have been successfully checked or in a later system test run be checked successfully.

In order to enable a system under test 2 in a specific or defined system state Z _x, a TEST CASE is at a Moegli ^¬ Chen from selected with a particular or selected optimal Testsequenzpräfix guide form. This selection can be carried out either automatically or by a user or user in accordance with a predetermined optimization criterion. For example, the one Testsequenzpräfix is selected, the _x has a minimum Testausführungszeit- duration until reaching the defi ned ^¬ system state Z. Alternatively, the one optimal Testse ^¬ quenzpräfix can be selected, which has a minimum Res ^¬ source needed for the system to be tested. 2 Beispielswei ^¬ se is selected the one Testsequenzpräfix, leading to a minimal energy consumption. The optimization or selection criterion can also consist of a combination of essential criteria. For example, the optimization criterion or selection criteria can be calculated from a combination of a criterion "time requirement" and a criterion "energy consumption". energy requirement exist ". Such a combined selection ^¬ criterion can in particular be formed when two essential criteria such as time required and energy requirements are in conflict with each other. For example, can be used a combined selection criterion, if the system under test 2 at a high speed operation consumes a lot of energy and little energy ver ^¬ needs at a low speed operation. it is also possible to use a weighted sum ver ^¬ VARIOUS essential criteria such as time required and energy consumption. The weight can be carried out by weighting factors, which are preferably adjustable. In another possible disclosed embodiment, the test device of the invention can be used a combination of elementary criteria with addition of a limiting function. for example, the Selekti ^¬ onskriterium are that the energy requirement of the system under test 2 should not exceed a certain threshold and the system to be tested 2 while working as quickly as possible. The system to be tested 2 is brought by the test apparatus 1 in the determined system state Z _x, where the system 2, starting from egg ^¬ nem initial system state of the system are added by means of test steps TS of the selected test cases in the certain or predetermined system status Z _x is, wherein the selected TEST CASE for each particular system state has the respective optimal test sequence prefix. In a mög ^¬ union disclosed embodiment, the test device 1 to a user interface for inputting the optimization criterion or selection of a Testsequenzpräfixes. The test stimuli T-STI of the test steps TS of the optimum Testsequenzpräfixes until reaching the particular system state _x Z have the acceleration test modules for the respective Systemzu ^¬ stood by the test device 1 is generated and stored in the repo 1B sitory. The acceleration test modules are thereby dynamically generated during the runtime of the system test run in one possible embodiment. In an alternative embodiment, the acceleration test modules are preceded by the Test device 1 generated and stored in the repository 1B. The acceleration test modules stored in the repository 1B of the test apparatus 1 are dynamically loaded and executed at runtime of the system test run by the execution unit 1A of the test apparatus 1.

In the exemplary embodiment illustrated in FIG. 3, the test device 1 tests a system 2 to be tested, for example an embedded system comprising a plurality of hardware and software components. In a further possible disclosed embodiment, the test apparatus 1 simultaneously tests several gleicharti ^¬ ge or different types to be tested systems 2. Assigns a system under test 2 an error and a defect, can in a possible disclosed embodiment, a corresponding fault leranzeigesignal by the test device 1 generates the ^¬ who.

4 shows an exemplary embodiment for illustrating the mode of functioning of the test device 1 according to the invention for testing an embedded system 2, which in the illustrated simple example comprises four components, namely two software components SW-K _A , SW-K _B and two hardware components HW-Kc, HW-K _D. The hardware components HW-K may be components, for example a sensor or the like. In the simple example shown in FIG. 4, the hardware component HW-K _D consists, for example, of a temperature sensor which measures an ambient temperature T. This temperature sensor is controlled by a corresponding software component SW-K _DB in the illustrated example, for example by reading the measured temperature T at certain times. For each component of the real embedded systems 2 in the data memory of the test device 1 a corresponding test service module may be pre see ^¬. As shown in Fig. 4, the Testvor- 1B appropriate software testing service modules SW-SM _A, SW-SM _B contains device 1 in its repository for testing of both software ^¬ components SW-K _A, SW-K _B and two hardware test service modules HW-SMc, HW-SM _D for testing the corresponding hardware components HW-K _C and HW-K _D of the system under test 2.

In the example shown in FIG. 4, ware test service module SW-SM _B is applied via an interface an ent ^¬ speaking test stimulus signal T-STI to be tested Ser ^¬ vice component SW-K _B which a corresponding test-response signal by the soft- T-RES back via the interface to the test device 1 for evaluation or review. In the illustrated simple example, the

Software component SW-K _{B of} the embedded system 2, the hardware ^¬ component HW-K _D , for example, a temperature sensor. When testing the software component SW-K _B corresponding accesses of the software component SW-K _{B are} umgemapped to the hardware component controlled by HW-K _D or redirected to the corresponding test hardware service module HW-SM _D , for example, a temperature sensor simulates or . abbil ^¬ det. The service component SW-K _B of the system under test 2, which is tested under control of the corresponding test service module SW-SM _B, sets appropriate hardware commands or commands that are provided in normal operation for the controlled hardware ^¬ component H-K _D, to the corresponding test hardware module HW-SM _D , which reacts accordingly and returns a corresponding hardware response HW-RES to the software component SW-K _B just tested. In this way it is possible, when testing a hardware component in ^¬ play, the hardware component HW K _D of the test system 2 to reproduce the behavior by an associated confi ^¬ rierbares hardware test service module HW SM _D. In one possible embodiment, the associated one simulates

Test hardware service module hardware component example ^¬ as the hardware component HW K _D, one to be tested confi ^¬ rierbares misconduct of the hardware component HW K _D. In ^¬ play, a malfunctioning of a tem- peratursensors can be tested in a simple manner in this way, without a corresponding manipulation must be pre ^¬ accepted to the real temperature sensor and the corresponding hardware component H-K _D. For example, the test Hardware service module HW-SM _D configured such that it simulates a malfunction of the sensor, such as a complete failure or incorrectly displayed Tempe ^¬ rature. For example, simulating that of the hardware sensor always outputs a (faulty) temperature of 100 ° C or FEH ^¬ lerhafte temperature of 0 ° C. In this way can be simulated ge ^¬ testing and how the real system 2, which includes a corresponding software component SW-K, behaves in a malfunction of a component controlled by the software SW-K hardware component HW-K.

In one possible embodiment of the test device according to the invention, groups of components are assigned to one or more test modules or test service modules. This plays a role especially when considering coupled error cases. For example, one would like to manipulate not only ei ^¬ ne cooling water temperature by a faulty measurement, but at the same time the position of a corresponding throttle. In this simple application example, a test module is provided which is supplied ^¬ assigns a plurality of components and not just a single component within the system to be tested. 2

In a possible disclosed embodiment, these groups are not similarly constructed from components or structured, wherein in the repository 1B are also different combinatio ^¬ NEN provided.

In a further possible disclosed embodiment of the test device according to the invention are acceleration test modules per ^¬ weils supplied ^¬ assigns a system component of the system under test 2 or a grouping of system components of the system to be tested. 2

In the test apparatus 1 according to the invention, a set of planned tests or test runs can be input as input data into the test apparatus 1. The possible USE CASES or test cases are analyzed and analyzed for each dene system states of the system under test 2 can Testse ^¬ quenzpräfixe and test frequency postfixes, for example by means of an optimization criterion can be determined. Finally, a planning of the various tests or test runs can be carried out based on the available test modules, for example by a workflow engine. The required test modules are dynamically loaded, executed and written back or unloaded at runtime.

For testing of embedded systems hardware and software components can ^¬ an enumeration of TEST CASES and associated test steps TS are performed by using a service-oriented architecture SOA in the test device 1 first. Subsequently, an analysis of the equivalence classes in order to find common Testsequenzpräfixe and ent ^¬ speaking test sequence postfixes. The serviceorien ^¬ oriented architecture SOA can be used to form or generate acceleration test modules, the real hardware and software components of the system under test Z replaced by test service modules or replaced ^¬ to. In this case, the test service modules are software modules that are loaded from a repository 1B of the test device 1.

The system 1 to be tested can be brought into an untypical or rare predefined system state or error state by the test device 1 according to the invention. Since ^¬ acceleration test ^modules are preferably used to complete the displacement of the system Z in this atypical system state Z _x in the shortest possible time. The use of a service-oriented architecture SOA for the test device 1 allows modularization and loose coupling. Furthermore, the test apparatus 1 according to the invention has the advantage that test runs can be performed faster by abbreviating and Verknüp ^¬ fen of test modules. Furthermore, the test coverage is increased by the test device 1 according to the invention, since there are many different test paths until a system state is reached. The increase in test coverage can be achieved by considering equivalence classes happen. Furthermore, it is possible with the test device 1 according to the invention to specifically achieve system errors or specifically a system behavior of the system 2 to be tested by simulation of hardware / software errors by corresponding software test services loaded from the repository 1B of the test device 1. The test device 1 according to the invention can be used in the development of a system 2 to be tested. Furthermore, the erfindungsge ^¬ Permitted test device can be used even after delivery of the system 2 at a customer for maintenance purposes or in an extension or modification of a system 2.

Claims

claims

Test device (1) for efficiently performing system test runs in a system (2),

wherein, for each USE CASE of the system under test (2), an associated TEST CASE is provided by the test device (1) comprising a sequence of test steps (TS) in each of which a test stimulus (T-STI) is sent to the system under test (2) applied and caused thereby test response (T-RES) of the system to be tested (Z) by the test device (1) is checked, wherein the system to be tested (Z) in a system test ^¬ run starting from an initial system state ( Z ₀ ) is put into a different system state at each test step (TS) of the TEST CAS until an end system state (Z _n ) for the respective TEST CASE is reached,

wherein the acceleration of each additional system test run at a TESTCASE the system to be tested (Z) di ^¬ rectly in a certain system state (Z _x) is displaced by the test device (1) by at the test steps (TS) for reaching the particular system state ( Z _x ) only the associated test stimuli (T-STI) without test-response check (T-RES) are applied to the system (Z) to be tested by the test device (1), provided that they reach the determined system state (Z _x ) Test Responses (T-RES) received in at least one system test run are successfully checked.

Test device according to claim 1,

wherein a sequence of test steps (TS) of a TEST CASES starting from the initial system state (Z _o ) until reaching the particular system state (Z _x ) forms a test ^¬ sequence prefix, and

wherein a sequence of test steps (TS) of a TEST CASES starting from the determined system state (Z _x ) until reaching the Endsystemzustandes (Z _n ) for each TEST CASE jewei ^{¬ term} forms a test sequence postfix.

Test device according to claim 2,

wherein the system under test (Z) by the Testvor ^¬ device (1) in the determined system state is brought (Z _x),

in that the system (Z) is put into the determined system state (Z _x ) by means of test steps (TS) of a selected TEST CAS, starting from the initial system state (Z ₀ ) of the system (Z),

wherein the selected TEST CASE _(x Z) has an optimal test sequence ^¬ prefix for each particular system state.

Test device according to claim 3,

wherein the optimal test sequence prefix has a minimum test execution duration for attaining the determined system state (Z _x ) and / or a minimum resource ^requirement for the system (Z) to be tested.

Test device according to claim 3 or 4,

wherein the test stimuli (T-STI) of the test steps (TS) of the optimum for achieving the Testsequenzpräfixes be ^¬ voted system state (Z _x) are generated as Beschleunigungstestmo ^¬ modules for each system state by the test apparatus (1).

Test device according to claim 5,

wherein the acceleration test modules are generated during the run time of the system test run or before the start of a further system test run by the test device (1).

Test device according to claim 5 or 6,

wherein the generated acceleration test modules are stored in a repository (1B) of the test device (1) for a system component or a group of system components of the system under test (2).

8. Test device according to claim 7, wherein the acceleration test modules stored in the repository (1B) of the test apparatus (1) are dynamically loaded and executed at runtime of the system test run by an execution unit (1A) of the test apparatus (1).

Test device according to claims 1 - 8,

wherein the test device (1) comprises a service-oriented architecture (SOA) and via a data interface ^¬ point directly to the system under test (Z) is integrally Schlos ^¬ sen or via a data network to the system under test (2) is connected.

Test device according to claims 7 - 9,

wherein to be tested by said test device (1) system (Z) is an embedded system that Hardwarekompo ^¬ components comprising (HW-K) and software (SW-K), wherein in the repository (1B) of the test device (1) for each component or group of components of the system under test (2) is provided with at least one corresponding test service module.

Test device according to claim 10,

wherein for testing a hardware component (HW-K) of the system to be tested (Z) the associated Testsservicemo ^¬ dul (HW-SMI) of the hardware device (HW-K) a to tes ^¬ tendes configurable malfunction of the Hardwarekompo ^¬ component (HW-K) simulated.

Test device according to claim 1 - 11,

wherein the test device (1) is integrated in the system (2) to be tested.

Test method for efficiently performing test system runs in a system (Z),

wherein, for each USE CASE of the system (Z) to be tested, an associated TEST CASE is provided which has a sequence of test steps (TS) in which because a test stimulus (T-STI) is applied to the system (Z) to be tested and a test response (T-RES) of the system (Z) to be tested is checked,

wherein the system to be tested (Z) is set in a system test ^¬ run starting from an initial system state (Z ₀ ) at each test step (TS) of the TEST CASES in another system state until an end system state (Z _u ) for the respective TEST CASE and in order to accelerate each further system test run in a TEST CASE, the system (Z) to be tested is set directly in a specific system state (Z _x ),

in the test steps (TS) of the TEST CASES until the specific system state (Z _x ) has been reached, only the corresponding test stimuli (T-STI) without test-response check are applied to the system (Z) to be tested, provided that this is the case until reaching the certain system state (Z _x ) in at least one other system ^¬ test run test responses received (T-RES) are successfully tested.

Test method according to claim 13,

wherein the test method generates acceleration test modules when performing system test runs and stores them for further system test runs on the system (Z) in a repository (1B).

Test method according to claim 13 or 14,

wherein the system development, system maintenance, system diagnostics, or system expansion testing procedure is performed by a test device (1) connected to the system under test (Z) or integrated into the system (Z) under test.